Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Rigid-flex circuits with raised features as IC test probes

Rigid-flex circuits with raised features as IC test probes

US Patent 5264787 · Granted Nov 23, 1993

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Fingerprint reader2020
Fingerprint reader2019
Electrical connector having improved elastomeric contact pressure pad2005
Dielectric interconnect frame incorporating EMI shield and hydrogen absorber for2004
Multilayer thin film hydrogen getter and internal signal EMI shield for complex 2004
De-mountable, solderless in-line lead module package with interface2003
Bump contact force concentration system and method2003
Commercial plating of nanolaminates2003
Connector assembly for flexible circuits2003
Wafer scale burn-in socket2001
Bumps with plural under-bump dielectric layers2000
Chip scale package2000