Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for deflection measurements using eddy current effects

Method and apparatus for deflection measurements using eddy current effects

US Patent 5214379 · Granted May 25, 1993

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for dual amplitude dual time-of-flight ultrasonic imaging1998
Method and apparatus for non-contact hole eccentricity and diameter measurement1994
Method and apparatus for determination of material residual stress1993
Method for advanced material characterization by laser induced eddy current imag1992
Eddy current surface mapping system for flaw detection1988