Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5750895 | Method and apparatus for dual amplitude dual time-of-flight ultrasonic imaging | David W. Butler | 1998-05-12 |
| 5339031 | Method and apparatus for non-contact hole eccentricity and diameter measurement | — | 1994-08-16 |
| 5214379 | Method and apparatus for deflection measurements using eddy current effects | — | 1993-05-25 |
| 5193395 | Method and apparatus for determination of material residual stress | Yury Flom | 1993-03-16 |
| 5124640 | Method for advanced material characterization by laser induced eddy current imaging | — | 1992-06-23 |
| 4755753 | Eddy current surface mapping system for flaw detection | — | 1988-07-05 |