Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for scan testing of logic circuit networks

System for scan testing of logic circuit networks

US Patent 5155432 · Granted Oct 13, 1992

Estimated economic value: $4,832,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Tunneling device2016
Hybrid cooling system for automatic test equipment2005
Configurable parallel and bit serial load apparatus1999
Configurable parallel and bit serial load apparatus1999
Configurable parallel and bit serial load apparatus1998
Configurable parallel and bit serial load apparatus1998
Deskewed clock distribution network with edge clock1998
Fast pipeline frame full detector1997
Structure and method for programming antifuses in an integrated circuit array1994
Control valve assembly with concentric spools1993
Structure and method for producing mask-programmed integrated circuits which are1991
System for scan testing of logic circuit networks1991