Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System of measuring a state density in a semi-conductor element and a method using this system

System of measuring a state density in a semi-conductor element and a method using this system

US Patent 5036273 · Granted Jul 30, 1991

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device for electrostatic discharge protection2006
Layout configurable electrostatic discharge device for integrated circuits2004
Device and circuit for electrostatic discharge and overvoltage protection applic2003
Method for fabricating ferro-electric thin films using a sol-gel technique2001
Method of erasing a flash EEPROM memory cell array optimized for low power consu2001
Method of erasing a flash EEPROM memory cell array optimized for low power consu2001
Contacted cell array configuration for erasable and programmable semiconductor m2001
Contacted cell array configuration for erasable and programmable semiconductor m2001
Device and method for multi-level charge/storage and reading out2000
Device and method for multi-level charge/storage and reading out2000
Method of programming a flash EEPROM memory cell array optimized for low power c2000
Method of programming a flash EEPROM memory cell array optimized for low power c2000