{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits", "item": "https://www.patentleaderboard.com/patent/5012100"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits

Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits

US Patent 5012100 · Granted Apr 30, 1991

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Monochromator for charged particles2003
Antenna for nuclear magnetic resonance tomography1997
Apparatus for removing ions from an electron beam1997
Objective lens for producing a radiation focus in the inside of a specimen1993
Particle beam apparatus having an immersion lens arranged in an intermediate ima1992
Method and apparatus for investigating latch-up propagation in complementary-met1991
Method and apparatus for investigating latch-up propagation in complementary-met1991
Electron beam measuring instrument1990
Method for the indirect identification of the intensity distribution of particle1988
Electrostatic-magnetic lens for particle beam apparatus1988
Spectrometer lens for particle beam apparatus1988
Electrostatic opposing field spectrometer for electron beam test methods1988