Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for high speed integrated circuit testing

Method and apparatus for high speed integrated circuit testing

US Patent 4972413 · Granted Nov 20, 1990

Estimated economic value: $3,372,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Deliberate destruction of integrated circuits2012
Deliberate destruction of integrated circuits2010
Deliberate destruction of integrated circuits2009
Method for measuring time and structure therefor2000
Wiping contacts2000
Method for measuring time and structure therefor1998
Method for testing integrated devices1997
Cantilever spring and method for temporarily coupling a semiconductor device to 1996
Integrated circuit test with programmable source for both AC and DC modes of ope1995
Apparatus and method of correcting loss of test contact continuity1995
Method and apparatus for picking and placing an article1995
Integral semiconductor wafer map recording1993