Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8149012 | Deliberate destruction of integrated circuits | Robert V. Lazaravich, Robert W. Ellis | 2012-04-03 |
| 7804319 | Deliberate destruction of integrated circuits | Robert V. Lazaravich | 2010-09-28 |
| 7532027 | Deliberate destruction of integrated circuits | Robert V. Lazaravich | 2009-05-12 |
| 5256578 | Integral semiconductor wafer map recording | Dean Corley | 1993-10-26 |
| 5233510 | Continuously self configuring distributed control system | Roger Brueckner | 1993-08-03 |
| 5177438 | Low resistance probe for semiconductor | Marion I. Simmons | 1993-01-05 |
| 5142449 | Forming isolation resistors with resistive elastomers | Charles R. Collis | 1992-08-25 |
| 5012187 | Method for parallel testing of semiconductor devices | — | 1991-04-30 |
| 5008615 | Means and method for testing integrated circuits attached to a leadframe | — | 1991-04-16 |
| 4989209 | Method and apparatus for testing high pin count integrated circuits | Mavin C. Swapp | 1991-01-29 |
| 4985988 | Method for assembling, testing, and packaging integrated circuits | — | 1991-01-22 |
| 4972413 | Method and apparatus for high speed integrated circuit testing | Mavin C. Swapp | 1990-11-20 |
| 4968931 | Apparatus and method for burning in integrated circuit wafers | Marion I. Simmons | 1990-11-06 |
| 4928002 | Method of recording test results of die on a wafer | Dean Corley | 1990-05-22 |
| 4604744 | Automated circuit tester | Mavin C. Swapp | 1986-08-05 |