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Home › Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal

Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal

US Patent 4833403 · Granted May 23, 1989

Estimated economic value: $37,744,000 ⓘ

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