Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for electrically contactlessly measuring the thickness of electrically conducting thin films on non-conducting travelling webs in vacuum deposition apparatus

Apparatus for electrically contactlessly measuring the thickness of electrically conducting thin films on non-conducting travelling webs in vacuum deposition apparatus

US Patent 4682105 · Granted Jul 21, 1987

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device for the prevention of arcing in vacuum sputtering installations2002
Apparatus and process for the non-destructive measurement of the ohmic resistanc1993
Device for recognizing the impact site of a charge carrier beam on a target1991
Device and method for the control and monitoring of an electron beam for metal w1990
Apparatus for the non-destructive measurement of the ohmic resistance of thin la1990
Circuit arrangement for the combined application of an inductive and capacitativ1990
Apparatus for detecting the position of incidence of a beam of charge carriers o1989
System for determining the thickness of varying material coatings1989
Direct-current-alternating-current inverter comprising a load which gains by for1987
Method and system for a vacuum evaporative deposition process1986
Arrangement and photometer for measuring and controlling the thickness of optica1980