{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Probe device for testing an integrated circuit", "item": "https://www.patentleaderboard.com/patent/4623839"}]}

Home › Probe device for testing an integrated circuit

Probe device for testing an integrated circuit

US Patent 4623839 · Granted Nov 18, 1986

Assignee

No assignee recorded.

Inventors

Oliver R. Garretson (2 patents)
Gordon Watson (3 patents)

View full patent text on Google Patents →