Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit test apparatus test head

Integrated circuit test apparatus test head

US Patent 4517512 · Granted May 14, 1985

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for analyzing measurements2004
Analysis of noise in repetitive waveforms2002
Method and apparatus for jitter analysis2002
Method and apparatus for analyzing measurements2001
Analysis of noise in repetitive waveforms2001
Transmission line connector and contact set assembly for test site1986
AC parametric circuit having adjustable delay lock loop1985
Delay lock loop1982
Delay lock loop modulator and demodulator1982
Frequency to voltage converter for cardiac communication system1980