Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing method and apparatus for dram

Testing method and apparatus for dram

US Patent 4468759 · Granted Aug 28, 1984

Estimated economic value: $37,185,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device and method for controlling a physical system2025
Device and method for activating a conveyor device2024
Robot, device and a method for central pattern generator(CPG) based control of a2016
Cascode sense AMP and column select circuit and method of operation2002
Digital variable-delay circuit having voltage-mixing interpolator and methods of2002
Coherent variable length reads from system memory2001
Integrated circuit memory having a fuse detect circuit and method therefor2000
Coherent variable length reads which implicates multiple cache lines by a memory2000
Buffer circuit, memory device, and integrated circuit for receiving digital sign2000
Square-law clamping circuit2000
Layout for noise reduction on a reference voltage1997
Delay locked loop for detecting the phase difference of two signals having diffe1997