Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and technique for testing IC memories

Apparatus and technique for testing IC memories

US Patent 4430735 · Granted Feb 7, 1984

Estimated economic value: $1,844,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High throughput processors2022
Processor with reconfigurable pipelined core and algorithmic compiler2021
Processor with reconfigurable pipelined core and algorithmic compiler2019
Disk drive flushing write cache to a nearest set of reserved tracks during a pow2010
Presilicon disk model for design, development and validation2006
Apparatus for providing cost efficient power measurement1987
Byte-oriented line adapter system1985
Testing system for reliable access times in ROM semiconductor memories1985
I/O subsystem using slow devices1985
Interrupt system for peripheral controller1984
Bit-oriented line adapter system1984
Subsystem controller1984