Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Virtual metrology method based on convolutional autoencoder and transfer learning and system thereof

Virtual metrology method based on convolutional autoencoder and transfer learning and system thereof

US Patent 12481879 · Granted Nov 25, 2025

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe card and manufacturing method thereof2025
Semiconductor structure and circuit structure2025
Molded semiconductor device and manufacturing method of molded semiconductor dev2025
Tourniquet having uneven surfaces2025
Golden path search method for manufacturing process and system thereof2025
Package structure and manufacturing method thereof2025
Hybrid system and method for distributed virtual power plants integrated intelli2025
Multiple-variable predictive maintenance method for component of production tool2025
Three-dimensional integrated circuit structures and methods of forming the same2025
Package structure2025
Molding apparatus and manufacturing method of molded semiconductor device2024
Virtual metrology method using convolutional neural network and computer program2024