Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Interference scanning transmission electron microscope

Interference scanning transmission electron microscope

US Patent 12406825 · Granted Sep 2, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Interferometric electron microscope2021
Sample holding mechanism, manufacturing method for same, and charged particle be2020
Electron microscope for magnetic field measurement and magnetic field measuremen2020
Apparatus and method for measuring energy of electrons2019
Method and device for measuring energy of electrons excited by sunlight2017
Sample holder, method for use of the sample holder, and charged particle device2014
Interference electron microscope2014
Electron beam device including a first electron biprism to split an electron bea2014
Sample device for charged particle beam2014
Transmission electron microscope and sample observation method2013
Electron microscope2013
Fixation device for a sample case for an electron microscope2012