Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of identifying vulnerable regions in an integrated circuit

Method of identifying vulnerable regions in an integrated circuit

US Patent 12298343 · Granted May 13, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Assembly and method for performing in-situ endpoint detection when backside mill2025
Systems and methods for measuring unique microelectronic electromagnetic signatu2025
Systems and methods for precise signal injection into microelectronic devices2025
High resolution imaging of microelectronic devices2025
Fabricated layout correlation2025
Causal relational artificial intelligence and risk framework for manufacturing a2025
Systems and methods for inspection of IC devices2025
Recovery of a hierarchical functional representation of an integrated circuit2025
Data handling and machine learning2025
Multimodal inspection system2024
Systems and methods for inspection of IC devices2024
System and method for rapid inspection of printed circuit board using multiple m2024