Die inspection method and apparatus

Assignee

• Ontario Die International

Inventors

• Wesley Scott (6 patents)
• Darryl Neil Poworoznyk (1 patents)
• Mandeep Singh Bhatia (2 patents)
• Petr Piro (2 patents)
• Paul Sajecki (2 patents)
• Eliel Paul Amora (1 patents)
• Trevor Sean Barnwell (2 patents)
• Sebastian Mocny (1 patents)

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