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Mandeep Singh Bhatia

OI Ontario Die International: 1 patents #6 of 19Top 35%
GE: 1 patents #19,878 of 36,430Top 55%
📍 New Delhi, IN: #2 of 2 inventorsTop 100%
Overall (All Time): #1,788,534 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12152995 Die inspection method and apparatus Wesley Scott, Darryl Neil Poworoznyk, Petr Piro, Paul Sajecki, Eliel Paul Amora +2 more 2024-11-26
8424098 System and method for enhanced data security Ramkumar Saptharishi 2013-04-16