Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope

Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope

US Patent 11892471 · Granted Feb 6, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Carbon-coated nickel-aluminum nanocomposite, preparation method therefor and app2025
System and method for automated construction of data sets for retraining a machi2025
Salt form and crystal form of mutant IDH1 inhibitor and preparation method there2025
Method and apparatus for sharing data across groups2025
Planar transformer, power conversion circuit, and adapter2025
Image detection method, non-transitory computer-readable storage medium and vehi2025
Liquid cooling plate and server2025
Liquid cooling plate assembly and server2025
Methods and systems for smart API polling for predicted delivery events2024
Battery management unit to determine updated SOC and energy reading, energy stor2024
Triple-layer shoe insole2024
Methods and devices for generating a blurred image2024