Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11892471 | Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope | Jialin Shi, Peng Yu | 2024-02-06 |
| 11789037 | Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope | Jialin Shi, Peng Yu | 2023-10-17 |
| 11633242 | Deformable mechanism with combined motion | Hao Liu, Guohao Jiang, Yuanyuan Zhou, Zhongtao Zhang, Wei Guo | 2023-04-25 |