Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Device and method for measuring interfaces of an optical element

Device and method for measuring interfaces of an optical element

US Patent 11808656 · Granted Nov 7, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and a system for characterising structures through a substrate2025
Device and method for measuring interfaces of an optical element2025
Device and method for imaging and interferometry measurements2024
Method and a system for characterizing structures through a substrate2024
Method and a system for characterising structures through a substrate2024
Apparatus provided with a capacitive detection and electric line(s) in the capac2023
Low-coherence reflectometry method and device employing time-frequency detection2022
Low-coherence reflectometry method and device employing time-frequency detection2022
Multi-distance detection device for a robot, and robot equipped with such (a) de2021
Method for 2D/3D inspection of an object such as a wafer2019
Chromatic confocal device and method for 2D/3D inspection of an object such as a2017
Chromatic confocal device and method for 2D/3D inspection of an object such as a2016