Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for generating calibration data for wafer analysis

Methods and systems for generating calibration data for wafer analysis

US Patent 11644426 · Granted May 9, 2023

Estimated economic value: $42,400,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Die-to-multi-die wafer inspection2023
Computerized method for configuring an inspection system, computer program produ2021