Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafers

Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafers

US Patent 11525777 · Granted Dec 13, 2022

Estimated economic value: $35,358,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cathodoluminescence focal scans to characterize 3D NAND CH profile2023
Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wa2022
Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wa2022
Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wa2022
Optical inspection2021
Optical inspection2021
System and method for multiple mode inspection of a sample2019
Calibratable beam shaping system and method2017
Calibratable beam shaping system and method2016