Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring a height map of a test surface

Method for measuring a height map of a test surface

US Patent 11493330 · Granted Nov 8, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Metrology system with projected pattern for points-from-focus type processes2023
Shape measuring method2022
Optical interference measuring device2020
Method for measuring a height map of multiple fields of view and combining them 2020
Method and apparatus for inner diameter measurement of transparent tube2019
Method for measuring a high accuracy height map of a test surface2018
Image sequence and evaluation method and system for structured illumination micr2017