Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587246 | Metrology system with projected pattern for points-from-focus type processes | Shannon Roy Campbell | 2023-02-21 |
| 11530914 | Shape measuring method | Hideyuki Arai | 2022-12-20 |
| 11493330 | Method for measuring a height map of a test surface | Hendrik Ketelaars, Adriaan Tiemen ZUIDERWEG, John Quaedackers | 2022-11-08 |
| 9568304 | Image sequence and evaluation method and system for structured illumination microscopy | Han Haitjema, Frans de Nooij | 2017-02-14 |