Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus

X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus

US Patent 11490498 · Granted Nov 1, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

X-ray phase imaging system2024
X-ray imaging apparatus2023
X-ray imaging apparatus2023
X-ray inspection device, management server for X-ray inspection device, and mana2023
Deterioration determination method and deterioration determination device for in2023
Deterioration determination method and deterioration determination device for in2023
X-ray imaging apparatus and consumption level estimation method for X-ray source2022
X-ray imaging apparatus and consumption level estimation method for X-ray source2022
X-ray inspection device and method for determining degree of consumption of targ2020
X-ray inspection device and method for determining degree of consumption of targ2020
X-ray generation device, X-ray fluoroscopic image photographing device and CT im2020
X-ray inspection apparatus2019