Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12072302 | X-ray phase imaging system | Yuto MAEDA, Jiro Masuda, Kana KOJIMA, Takahiro DOKI | 2024-08-27 |
| 11662322 | X-ray imaging apparatus | Goro Kambe, Futoshi Ueki | 2023-05-30 |
| 11656189 | X-ray inspection device, management server for X-ray inspection device, and management method for X-ray inspection device | Futoshi Ueki | 2023-05-23 |
| 11599990 | Deterioration determination method and deterioration determination device for industrial x-ray imaging apparatus | Goro Kambe | 2023-03-07 |
| 11490498 | X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus | Goro Kambe | 2022-11-01 |
| 11450502 | X-ray imaging apparatus and consumption level estimation method for X-ray source | Goro Kambe | 2022-09-20 |
| 10820399 | X-ray inspection device and method for determining degree of consumption of target of X-ray tube in X-ray inspection device | Goro Kambe | 2020-10-27 |
| 10631391 | X-ray generation device, X-ray fluoroscopic image photographing device and CT image photographing device | Futoshi Ueki | 2020-04-21 |
| 10398012 | X-ray inspection system | Futoshi Ueki | 2019-08-27 |