Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for determining candidate patterns from set of patterns of a patterning process

Method for determining candidate patterns from set of patterns of a patterning process

US Patent 11460784 · Granted Oct 4, 2022

Estimated economic value: $50,828,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Process window optimizer2024
Process variability aware adaptive inspection and metrology2024
Process window optimizer2022
Method and system for pattern configuration2021
Process variability aware adaptive inspection and metrology2021
Visualization performance metrics of computational analyses of design layouts2021
Process variability aware adaptive inspection and metrology2019
System and method to ensure source and image stability2016
Analysis optimizer2014
Pattern matching optical proximity correction2014
Analysis optimizer2013
Fast pattern matching2012