Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect displaying method

Defect displaying method

US Patent 11416979 · Granted Aug 16, 2022

Estimated economic value: $71,033,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for focusing charged—particle beams2025
Switching board and soldering method thereof2025
Cantilever with etch chamber flow design2025
Multiple landing energy scanning electron microscopy systems and methods2025
Modified deodorant urea-formaldehyde (UF) resin and use thereof, as well as part2025
Beam current adjustment for charged-particle inspection system2025
Fully automated SEM sampling system for e-beam image enhancement2025
Metrology data correction using image quality metric2025
System and method for defect inspection using voltage contrast in a charged part2025
Cross-talk cancellation in multiple charged-particle beam inspection2024
In-die metrology methods and systems for process control2024
Grounding cap module and gas injection device2024