Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for determining cause of abnormality in semiconductor manufacturing processes

System and method for determining cause of abnormality in semiconductor manufacturing processes

US Patent 11404331 · Granted Aug 2, 2022

Estimated economic value: $46,822,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multidimensional space vector modulation (MDSVM) circuit and method thereof2024
Attitude determination and control system and method thereof2023
Structure of an electronic component and an inductor2022
Motor and drive circuit and driving method the same2022
Transparent conductive film2022
Transparent conductive laminated structure including a first conductive film and2021
Transparent conductive film2021
Method to form an inductive component2020
WDM multiplexing/de-multiplexing system and the manufacturing method thereof2020
Integrally-formed inductor2020
Structure of an electronic component and an inductor2018
Dark current reduction for back side illuminated image sensor2017