Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11404331 | System and method for determining cause of abnormality in semiconductor manufacturing processes | Syuan-Rong Huang, Chun-Fu Tung, Hua-Ming Wang, Yung-Cheng Chang | 2022-08-02 |
| 7930298 | System and method for generating 'snapshot's of learning objects | Tsun Ku, Yi-Chi Chen | 2011-04-19 |