Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detection and correction of single event upset (SEU) in integrated circuit

Detection and correction of single event upset (SEU) in integrated circuit

US Patent 11283431 · Granted Mar 22, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection and correction of single event upset (SEU) in integrated circuit2023
Radiation-hardened break before make circuit2021
Radiation-hardened break before make circuit2018
Memory system having a unidirectional bus and method for communicating therewith2001
Sense amplifier/comparator circuit and data comparison method2001
Memory system having a unidirectional bus and method for communicating therewith2000
CMOS memory cell with improved read port1999
Memory in a data processing system having uneven cell grouping on bitlines and m1999
Sense amplifier circuit with minimized clock skew effect1998
Array row and column decoder apparatus and method1998
Output buffer incorporating shared intermediate nodes1998
Buffer with controlled hysteresis1997