Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer inspecting apparatus

Wafer inspecting apparatus

US Patent 11232551 · Granted Jan 25, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Antenna device and radar device2025
Semiconductor light-emitting device2025
Steel material suitable for use in sour environment2025
Measuring method2024
Setting apparatus2024
Semiconductor laser device2024
Nitride-based semiconductor light-emitting element and manufacturing method ther2024
Steel material and method for producing steel material2024
Substrate processing apparatus, substrate processing system, and substrate proce2024
Nitride-based semiconductor light-emitting element and manufacturing method ther2024
Substrate processing apparatus and substrate processing method2024
Nucleic acid detection or quantification method, chip and assay kit therefor, de2024