Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12181267 | Measuring method | — | 2024-12-31 |
| 11935227 | Notch detecting method | Shinji Yoshida | 2024-03-19 |
| 11232551 | Wafer inspecting apparatus | Shinji Yoshida, Koji Hashimoto | 2022-01-25 |