Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › MEMS probe card assembly having decoupled electrical and mechanical probe connections

MEMS probe card assembly having decoupled electrical and mechanical probe connections

US Patent 11156640 · Granted Oct 26, 2021

Estimated economic value: $15,202,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Vertical probe array having sliding contacts in elastic guide plate2025
Probe on carrier architecture for vertical probe arrays2022
Probe on carrier architecture for vertical probe arrays2022
Electrical test probes having decoupled electrical and mechanical design2021
Probe tip with embedded skate2021
Probe card assembly for testing electronic devices2017
Probe skates for electrical testing of convex pad topologies2016
Probes with high current carrying capability and laser machining methods2016
Multiple contact probes2016
Probe retention arrangement2016
Vertical probe array arranged to provide space transformation2016
Probe bonding method having improved control of bonding material2016