Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card with angled probe and wafer testing method using the same

Probe card with angled probe and wafer testing method using the same

US Patent 11105848 · Granted Aug 31, 2021

Estimated economic value: $13,167,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Intelligent information conversion for automatic driving2025
Desk lamp2024
Molecular beacon delivery system for directly detecting circulating tumor cells 2024
Probe card with angled probe and wafer testing method using the same2024
Probe card with angled probe and wafer testing method using the same2024
Probe card with angled probe and wafer testing method using the same2024
Alginate dentifrice compositions and methods of making thereof2023
System and method for dossier creation with linking dossiers and context passing2023
Brightness compensation method and related product2021
Display panel with a metal wire array disposed on the bending region of a flexib2020
Probe card and wafer testing system and wafer testing method2020
Probe card and wafer testing system and wafer testing method2020