Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994555 | Probe card with angled probe and wafer testing method using the same | Yuan-Chun Wu, Chang Xu | 2024-05-28 |
| 11687211 | System and method for dossier creation with linking dossiers and context passing | Qiong Wu, Jeffrey Clay Courcelle, Yingchun MEI, Xiaodi ZHONG, Alejandro Olvera Velasco | 2023-06-27 |
| 11105848 | Probe card with angled probe and wafer testing method using the same | Yuan-Chun Wu, Chang Xu | 2021-08-31 |
| 10670654 | Probe card and wafer testing system and wafer testing method | Yuan-Chun Wu, Chang Xu | 2020-06-02 |