Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Structure and method for testing three-dimensional memory device

Structure and method for testing three-dimensional memory device

US Patent 10998079 · Granted May 4, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ferroelectric memory reference generation2025
Dual-mode surface acoustic wave device and preparation method thereof2025
High capacity memory circuit with low effective latency2025
Ferroelectric memory writing method and associated devices2025
Ferroelectric memory local sense amplification2025
Ferroelectric memory reference generation2025
Wall shelf2025
Method and system for providing alternative result for an online search previous2025
Through array contact structure of three-dimensional memory device2024
Methods for forming ferroelectric memory devices2024
Memory devices having vertical transistors and methods for forming the same2024
Hybrid electrical connector and electrical connector assembly2024