{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Scatterometry system and method", "item": "https://www.patentleaderboard.com/patent/10970435"}]}

Home › Scatterometry system and method

Scatterometry system and method

US Patent 10970435 · Granted Apr 6, 2021

Estimated economic value: $20,861,000 ⓘ

Assignee

Nova Measuring Instruments

Inventors

Ruslan Berdichevsky (3 patents)
Eyal Grubner (3 patents)
Shai Segev (3 patents)

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