Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
EG

Eyal Grubner

NINova Measuring Instruments: 2 patents #43 of 108Top 40%
NONova: 1 patents #39 of 75Top 55%
Overall (All Time): #1,354,073 of 4,157,543Top 35%
3 Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11900028 Scatterometry system and method Ruslan Berdichevsky, Shai Segev 2024-02-13
10970435 Scatterometry system and method Ruslan Berdichevsky, Shai Segev 2021-04-06
10372845 Scatterometry system and method Ruslan Berdichevsky, Shai Segev 2019-08-06