Defect detection system using finite element optimization and mesh analysis

Assignee

• Michigan State University
• The United States Of America As Represented By The Secretary Of Army

Inventors

• S. Ratnajeevan H. Hoole (1 patents)
• Sivamayam Sivasuthan (1 patents)
• Victor Karthik (2 patents)
• Paramsothy Jayakumar (2 patents)
• Ravi S. Thyagarajan (1 patents)
• Lalita Udpa (6 patents)
• Arunasalam Rahunanthan (1 patents)

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