Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10949584 | Defect detection system using finite element optimization and mesh analysis | S. Ratnajeevan H. Hoole, Victor Karthik, Paramsothy Jayakumar, Ravi S. Thyagarajan, Lalita Udpa +1 more | 2021-03-16 |