Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of defect detection on a specimen and system thereof

Method of defect detection on a specimen and system thereof

US Patent 10853932 · Granted Dec 1, 2020

Estimated economic value: $39,153,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection of defects using a computationally efficient segmentation approach2025
Detecting defects in a semiconductor specimen2022
Security indicator scores2022
Detecting targeted locations in a semiconductor specimen2021
Method of examination of a specimen and system thereof2021
Real-time personalization product tracking B2B/B2C2021
Method of defect detection and system thereof2019
Method of generating an examination recipe and system thereof2019
Secure network access using credentials2019
MAC address determination using a personal WLAN2019
Method and system for book reading enhancement2019
Computer vision based driver assistance devices, systems, methods and associated2018