Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detecting targeted locations in a semiconductor specimen

Detecting targeted locations in a semiconductor specimen

US Patent 11107207 · Granted Aug 31, 2021

Estimated economic value: $168,860,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection of defects using a computationally efficient segmentation approach2025
Defect detection of a semiconductor specimen2025
Multi-perspective wafer analysis2023
Detecting defects in a semiconductor specimen2022
Detecting defects in a semiconductor specimen2022
Detecting defects in a semiconductor specimen2022
Detecting defects in a semiconductor specimen2022
Security indicator scores2022
Obtaining printed element data of patches to determine calibration data of a pri2021
Method of examination of a specimen and system thereof2021
Real-time personalization product tracking B2B/B2C2021
Computerized system and method for obtaining information about a region of an ob2021