Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High-speed tag lens assisted 3D metrology and extended depth-of-field imaging

High-speed tag lens assisted 3D metrology and extended depth-of-field imaging

US Patent 10812701 · Granted Oct 20, 2020

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Metrology system for measuring edge of circular workpiece2025
Metrology system utilizing annular optical configuration2025
Metrology system configured to illuminate and measure apertures of workpieces2025
Adjustable update rate for measuring probe2025
Field-of-view compression optics for angle tolerant electro-optic modulators2024
Energy efficient, high resolution light detection and ranging imaging receiver w2023
Workpiece inspection and defect detection system utilizing color channels2023
Modular configuration for coordinate measuring machine probe2023
Broadening the measurement range of optical shutter-gated light detection and ra2023
Shielding for sensor configuration and alignment of coordinate measuring machine2023
Metrology system configured to measure apertures of workpieces2023
Inductive position sensor signal gain control for coordinate measuring machine p2023