Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for at-speed scan shift frequency test optimization

Method and apparatus for at-speed scan shift frequency test optimization

US Patent 10746795 · Granted Aug 18, 2020

Estimated economic value: $53,577,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Near field communications (NFC)-based offload of NFC operation2019
Method and apparatus for validating a test pattern2018
Method and apparatus for validating a test pattern2018
Method and apparatus for adaptive graphics compression and display buffer switch2018
Apparatus, system and method of detecting an activity of a wireless communicatio2018
Method and apparatus for calculating delay timing values for an integrated circu2018
Method and apparatus for calculating delay timing values for an integrated circu2018
Method and apparatus for calculating delay timing values for an integrated circu2018
Electronic device and method for operating a power switch2018
Electronic device and method for operating a power switch2018
Scan test system with a test interface having a clock control unit for stretchin2018
Scan test system with a test interface having a clock control unit for stretchin2018