Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for inspecting defects on transparent substrate

Method and apparatus for inspecting defects on transparent substrate

US Patent 10677739 · Granted Jun 9, 2020

Estimated economic value: $12,218,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display device and method of driving the same2025
Pixel and display device including the same2025
Energy delivery optimization for laser thickness control of fusion glass system 2025
Apparatus and method for inspecting laser defect inside of transparent material2025
Apparatus and method for inspecting laser defect inside of transparent material2025
Methods and apparatus for plugging cells of ceramic structures and honeycomb fil2024
Method and system for measuring geometric parameters of through holes2023
System and method for detecting defects in a honeycomb body2023
System and method for detecting defects in a honeycomb body2023
Substrate edge test apparatus, system, and method2023
Substrate edge test apparatus, system, and method2023
Substrate edge test apparatus, system, and method2023