Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing MRAM device and test apparatus thereof

Method for testing MRAM device and test apparatus thereof

US Patent 10665321 · Granted May 26, 2020

Estimated economic value: $4,864,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

External magnetic field detection for MRAM device2025
Integrated circuit device and method for fabricating the same2025
Integrated circuit device and method for fabricating the same2025
Semiconductor device2025
DC and AC magnetic field protection for MRAM device using magnetic-field-shieldi2025
Semiconductor wafer testing system and related method for improving external mag2025
Semiconductor wafer testing system and related method for improving external mag2025
Semiconductor wafer testing system and related method for improving external mag2025
Semiconductor wafer testing system and related method for improving external mag2025
Package structure and method for fabricating the same2025
Package structure and method for fabricating the same2025
Package structure and method for fabricating the same2025