Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect classification method, method of sorting photomask blanks, and method of manufacturing mask blank

Defect classification method, method of sorting photomask blanks, and method of manufacturing mask blank

US Patent 10488347 · Granted Nov 26, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Nonvolatile memory, memory system, and control method of nonvolatile memory with2025
Measurement method, measurement system, and non-transitory computer readable med2025
Ceramic electronic component and circuit board2025
Optical inspection circuit and optical inspection method2025
Reflective mask blank and reflective mask2024
System for estimating the occurrence of defects, and computer-readable medium2024
Optical circuit for alignment and optical alignment method2024
Aligning optical circuit and aligning method2024
Inspection device and method2024
Ceramic electronic component and circuit board2024
Multi-layer ceramic electronic component and circuit board including the same2024
Defect inspection apparatus, method for inspecting defect, and method for manufa2024